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Proceedings Paper

Application of linear CCD in tunnel crack detection
Author(s): Jie Liu; Hua Li; Xin Jiang; Hemin Chang
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Paper Abstract

To meet the actual demand, the linear CCD technology is applied to tunnel crack detection, and an edge detection algorithm is proposed to measure the crack width. Firstly, the application form of linear CCD imaging technology in tunnel crack detection is introduced concretely in this paper. Then, the key influencing parameters of measurement are discussed. Finally, an edge detection algorithm based on the change of gray level in linear direction is proposed and it is verified by experiments. Experimental results indicated that the linear CCD imaging technology in tunnel crack detection could obtain measurement data quickly and improve the efficiency of tunnel cracks’ measurement, and that the detection algorithm could be used for the crack width measuring.

Paper Details

Date Published: 28 February 2017
PDF: 5 pages
Proc. SPIE 10256, Second International Conference on Photonics and Optical Engineering, 102562Y (28 February 2017); doi: 10.1117/12.2257653
Show Author Affiliations
Jie Liu, Univ. of Chinese Academy of Sciences (China)
Xi'an Institute of Optics and Precision Mechanics (China)
Hua Li, Xi'an Institute of Optics and Precision Mechanics (China)
Xin Jiang, Xi'an Institute of Optics and Precision Mechanics (China)
Hemin Chang, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 10256:
Second International Conference on Photonics and Optical Engineering
Chunmin Zhang; Anand Asundi, Editor(s)

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