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Proceedings Paper

Research of the wavefront detection method based on the scanning pentaprism
Author(s): Xueliang Zhu; Huiying Zhao; Longchao Dong; Ailing Tian; Daocheng Yuan; Xinxing Ban; Bingcai Liu; Yanan Tian
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Paper Abstract

With the rapid developing of science and technology, large aperture optical system plays an important role in the hightech fields including space optics, astronomical optics, inertial confinement fusion, the detecting and recognizing of space target. However, the problems of the wavefront sensing about large aperture optical system has been totally solved because of the equipment expenses and long manufacturing periods. In order to test the large aperture elements in optical system with cheaper costs and higher resolution, more and more attentions are paid into the wavefront sensing of large aperture optical systems. The scanning pentaprism system is introduced to divide the wavefront of the interferometer into a series of sub-wavefront, and the relative positions of the spot centroid accroding to every sub-wavefront are recorded on the CCD camera. The normal directions of every sub-wavefront are obtained to reconstruct the tested wavefront. Experimental results are accord with the interferometer measure results. The feasibility of the pentaprism scanning method has been validated. Finally the influences of measurement apparatus and environment on the measuring precision is discussed. Which is useful to expand the measuring range to keep high spatial resolution and reduce cost.

Paper Details

Date Published: 28 February 2017
PDF: 5 pages
Proc. SPIE 10256, Second International Conference on Photonics and Optical Engineering, 1025627 (28 February 2017); doi: 10.1117/12.2257394
Show Author Affiliations
Xueliang Zhu, Xi'an Jiaotong Univ. (China)
Xi'an Technological Univ. (China)
Huiying Zhao, Xi'an Jiaotong Univ. (China)
Longchao Dong, Xi'an Jiaotong Univ. (China)
Ailing Tian, Xi'an Technological Univ. (China)
Daocheng Yuan, Xi'an Jiaotong Univ. (China)
Xinxing Ban, Xi'an Jiaotong Univ. (China)
Bingcai Liu, Xi'an Technological Univ. (China)
Yanan Tian, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 10256:
Second International Conference on Photonics and Optical Engineering
Chunmin Zhang; Anand Asundi, Editor(s)

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