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Proceedings Paper

Calibration on the detection efficiency of the Si-APD and InGaAs-APD single-photon detectors by correlated photon pairs
Author(s): Xueshun Shi; Kun Zhao; Changming Liu; Haidong Chen; Kunfeng Chen; Haiyong Gan
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Paper Abstract

We demonstrated calibration on the detection efficiency of Si-avalanche photodiode (APD) and InGaAs-APD singlephoton detectors by correlated photon pairs at 780 nm and 1550 nm, respectively. The correlated photons were generated by spontaneous frequency down-conversion in a periodically poled potassium titanyl phosphate crystal (PPKTP) pumped by a pulsed fiber laser. The uncertainty of ~10-4 on detection efficiency was obtained for both single-photon detectors.

Paper Details

Date Published: 28 February 2017
PDF: 4 pages
Proc. SPIE 10256, Second International Conference on Photonics and Optical Engineering, 1025622 (28 February 2017); doi: 10.1117/12.2257323
Show Author Affiliations
Xueshun Shi, China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Kun Zhao, China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Changming Liu, China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Haidong Chen, China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Kunfeng Chen, China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Haiyong Gan, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 10256:
Second International Conference on Photonics and Optical Engineering
Chunmin Zhang; Anand Asundi, Editor(s)

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