Share Email Print
cover

Proceedings Paper

Automatic phase aberration compensation and imaging of digital holographic microscopy
Author(s): Xing Wang; Hong-wei Ma; Dou-dou Wang; Ming Dong; Yi-shu Zhang; Hao-tian Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The accuracy of numerical reconstruction phase directly affect the result of the digital holographic detection. Because the microscope objective causes additional secondary phase factor, resulting in phase distortion of the reconstructed image. In order to find the phase distortion present in the reconstruction process and take the appropriate way to achieve automatic compensation of phase, digital holographic microscopy in phase compensation issues are studied. Least-squares curve fitting method and choose a background profile data approach is employed to produce the phase mask, and several iterations of correction of mask data by profile data. The theoretical analysis and experimental comparison of this method was validated. The results show that this method can quickly and accurately for better phase distortion correction, while providing new ideas for efficient extraction of real phase.

Paper Details

Date Published: 28 February 2017
PDF: 10 pages
Proc. SPIE 10256, Second International Conference on Photonics and Optical Engineering, 102561N (28 February 2017); doi: 10.1117/12.2257072
Show Author Affiliations
Xing Wang, Xi'an Univ. of Science and Technology (China)
Hong-wei Ma, Xi'an Univ. of Science and Technology (China)
Dou-dou Wang, Xi'an Univ. of Science and Technology (China)
Ming Dong, Xi'an Univ. of Science and Technology (China)
Yi-shu Zhang, Xi'an Univ. of Science and Technology (China)
Hao-tian Wang, Xi'an Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10256:
Second International Conference on Photonics and Optical Engineering
Chunmin Zhang; Anand Asundi, Editor(s)

© SPIE. Terms of Use
Back to Top