Share Email Print
cover

Proceedings Paper

Analysis of the impact of the deposition optical fibers on the deformation measurement with a distributed system BOTDR
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Authors of this article analyzed the influence of the cover layer in combination with the fixation material to measure deformation with the distributed system Brillouin Optical Time Domain Reflectometry (BOTDR). This system is based on the principle of measuring stimulated Brillouin scattering, which is frequency dependent on the measured temperature and the mechanical stress of the optical fiber. Standard telecommunication optical fiber G.652.D was used for experiments to verify whether this widely used type of fibers initially intended for telecommunication transmissions is suitable for measuring the deformation with the distributed system BOTDR. Knowing the impact of encapsulation type optical fiber is important in the use and implementation in practical applications. The results clearly show that it is important to pay attention to the implementation type of optical fiber. Based on post-analysis, it was determined the most appropriate implementation of optical fiber for optimal sensitivity in practical applications.

Paper Details

Date Published: 27 April 2017
PDF: 6 pages
Proc. SPIE 10208, Fiber Optic Sensors and Applications XIV, 102080X (27 April 2017); doi: 10.1117/12.2256720
Show Author Affiliations
M. Fajkus, VSB-Technical Univ. of Ostrava (Czech Republic)
J. Nedoma, VSB-Technical Univ. of Ostrava (Czech Republic)
R. Martinek, VSB-Technical Univ. of Ostrava (Czech Republic)
L. Bednarek, VSB-Technical Univ. of Ostrava (Czech Republic)
J. Jaros, VSB-Technical Univ. of Ostrava (Czech Republic)
D. Hruby, VSB-Technical Univ. of Ostrava (Czech Republic)
F. Perecar, VSB-Technical Univ. of Ostrava (Czech Republic)
V. Vasinek, VSB-Technical Univ. of Ostrava (Czech Republic)


Published in SPIE Proceedings Vol. 10208:
Fiber Optic Sensors and Applications XIV
Christopher S. Baldwin; Gary Pickrell; Henry H. Du, Editor(s)

© SPIE. Terms of Use
Back to Top