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Proceedings Paper

Using quantum-dots to enable deep-UV sensitivity with standard silicon-based imaging detectors
Author(s): Robert Ichiyama; Zoran Ninkov; Scott Williams; Ross Robinson; Suraj Bhaskaran
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Paper Abstract

Improving the sensitivity of silicon-based CMOS and CCD in the deep-UV is an area of ongoing interest. Lumogen has been used for this purpose for many years but has several known issues including limitations to its use in both vacuum and radiation harsh environments. Quantum Dots (QD) offers a more robust alternative to Lumogen. The fluorescence wavelength of QDs is tunable and can be fabricated to match the peak sensor quantum efficiency. Aerosol jet printing (AJP) is being used for the deposition of QDs on a variety of substrates and on commercially available sensor arrays. While the films deposited onto various substrates have a surface morphology characterized by aggregate formations, the insight obtained will lead to much more uniform layers in the near future. Organic residues common to this process, that compromise the UV performance, have been minimized.

Paper Details

Date Published: 20 February 2017
PDF: 9 pages
Proc. SPIE 10110, Photonic Instrumentation Engineering IV, 1011011 (20 February 2017); doi: 10.1117/12.2256137
Show Author Affiliations
Robert Ichiyama, Rochester Institute of Technology (United States)
Zoran Ninkov, Rochester Institute of Technology (United States)
Scott Williams, Rochester Institute of Technology (United States)
Ross Robinson, Rochester Institute of Technology (United States)
Suraj Bhaskaran, Thermo Fisher Scientific Inc. (United States)


Published in SPIE Proceedings Vol. 10110:
Photonic Instrumentation Engineering IV
Yakov G. Soskind; Craig Olson, Editor(s)

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