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Proceedings Paper

High-speed and high-resolution quantitative phase imaging with digital-micromirror device-based illumination (Conference Presentation)
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Paper Abstract

Due to the large number of available mirrors, the patterning speed, low-cost, and compactness, digital-micromirror devices (DMDs) have been extensively used in biomedical imaging system. Recently, DMDs have been brought to the quantitative phase microscopy (QPM) field to achieve synthetic-aperture imaging and tomographic imaging. Last year, our group demonstrated using DMD for QPM, where the phase-retrieval is based on a recently developed Fourier ptychography algorithm. In our previous system, the illumination angle was varied through coding the aperture plane of the illumination system, which has a low efficiency on utilizing the laser power. In our new DMD-based QPM system, we use the Lee-holograms, which is conjugated to the sample plane, to change the illumination angles for much higher power efficiency. Multiple-angle illumination can also be achieved with this method. With this versatile system, we can achieve FPM-based high-resolution phase imaging with 250 nm lateral resolution using the Rayleigh criteria. Due to the use of a powerful laser, the imaging speed would only be limited by the camera acquisition speed. With a fast camera, we expect to achieve close to 100 fps phase imaging speed that has not been achieved in current FPM imaging systems. By adding reference beam, we also expect to achieve synthetic-aperture imaging while directly measuring the phase of the sample fields. This would reduce the phase-retrieval processing time to allow for real-time imaging applications in the future.

Paper Details

Date Published: 24 April 2017
PDF: 1 pages
Proc. SPIE 10074, Quantitative Phase Imaging III, 100740C (24 April 2017); doi: 10.1117/12.2256130
Show Author Affiliations
Renjie Zhou, Massachusetts Institute of Technology (United States)
Di Jin, Massachusetts Institute of Technology (United States)
Zahid Yaqoob, Massachusetts Institute of Technology (United States)
Peter T. C. So, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 10074:
Quantitative Phase Imaging III
Gabriel Popescu; YongKeun Park, Editor(s)

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