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Proceedings Paper

New generation of Fourier optics viewing angle measurement systems
Author(s): Pierre Boher; Thierry Leroux; Vincent Leroux; Thibault Bignon; Véronique Collomb-Patton
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Paper Abstract

We explain the technical bases of the Fourier Optics Technology (OFT) for viewing angle measurement of displays and the increasing capacities of the ELDIM systems over the years. A new generation of OFT systems devoted to quality control is introduced. In spite of a more compact size, the optic shows excellent performances in terms of angular aperture, angular resolution and collection efficiency. The detection is made with a new generation high resolution CMOS camera which allows very short measurement times. In addition, the probe can be used on a robotic arm to offer a cost effective solution for quality control of displays with any kind of size and shape.

Paper Details

Date Published: 16 February 2017
PDF: 12 pages
Proc. SPIE 10126, Advances in Display Technologies VII, 1012604 (16 February 2017); doi: 10.1117/12.2256125
Show Author Affiliations
Pierre Boher, ELDIM (France)
Thierry Leroux, ELDIM (France)
Vincent Leroux, ELDIM (France)
Thibault Bignon, ELDIM (France)
Véronique Collomb-Patton, ELDIM (France)


Published in SPIE Proceedings Vol. 10126:
Advances in Display Technologies VII
Liang-Chy Chien; Tae-Hoon Yoon; Sin-Doo Lee, Editor(s)

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