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Proceedings Paper

X-ray excited luminescent chemical imaging (XELCI) for non-invasive imaging of implant infections
Author(s): Donald Benza; Unaiza Uzair; Yash Raval; Tzuen-Rong J. Tzeng; Caleb J. Behrend; Jeffrey N. Anker
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Paper Abstract

X-ray excited luminescent chemical imaging (XELCI) uses a combination of X-ray excitation to provide high resolution and optical detection to provide chemical sensing. A key application is to detect and study implant-associated infection. The implant is coated with a layer of X-ray scintillators which generate visible near infrared light when irradiated with an X-ray beam. This light first passes through a pH indicator dye-loaded film placed over the scintillator film in order to modulate the luminescence spectrum according to pH. The light then passes through tissue is collected and the spectral ratio measured to determine pH. A focused X-ray beam irradiates a point in the scintillator film, and a pH image is formed point-by-point by scanning the beam across the sample. The sensor and scanning system are described along with preliminary results showing images in rabbit models.

Paper Details

Date Published: 23 February 2017
PDF: 9 pages
Proc. SPIE 10081, Frontiers in Biological Detection: From Nanosensors to Systems IX, 100810K (23 February 2017); doi: 10.1117/12.2256049
Show Author Affiliations
Donald Benza, Clemson Univ. (United States)
Unaiza Uzair, Clemson Univ. (United States)
Yash Raval, Clemson Univ. (United States)
Tzuen-Rong J. Tzeng, Clemson Univ. (United States)
Caleb J. Behrend, Virginia Tech Carilion School of Medicine and Research Institute (United States)
Clemson Univ. (United States)
Jeffrey N. Anker, Clemson Univ. (United States)


Published in SPIE Proceedings Vol. 10081:
Frontiers in Biological Detection: From Nanosensors to Systems IX
Amos Danielli; Benjamin L. Miller; Sharon M. Weiss, Editor(s)

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