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Proceedings Paper

Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress
Author(s): Carlo De Santi; Matteo Meneghini; Nicola Renso; Matteo Buffolo; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Andrea Migliori; Vittorio Morandi; Gaudenzio Meneghesso; Enrico Zanoni
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Paper Abstract

This paper demonstrates that when InGaN LEDs are submitted to a constant reverse bias, they can show a time-dependent breakdown, that leads to the catastrophic failure of the devices. By submitting green and blue LEDs to constant voltage stress in the range between -40 V and -60 V we demonstrate that: (i) under reverse bias conditions, current is focused on localized paths, whose positions can be identified by electroluminescence measurements, and that originate from the presence of extended defects; (ii) during a constant voltage stress, the reverse current of the LEDs gradually increases; (iii) for longer stress times, all devices show a time-dependent breakdown; (iv) time-to-failure has an exponential dependence on stress voltage, and is Weibull-distributed.

Paper Details

Date Published: 16 February 2017
PDF: 7 pages
Proc. SPIE 10124, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXI, 101240F (16 February 2017); doi: 10.1117/12.2256023
Show Author Affiliations
Carlo De Santi, Univ. degli Studi di Padova (Italy)
Matteo Meneghini, Univ. degli Studi di Padova (Italy)
Nicola Renso, Univ. degli Studi di Padova (Italy)
Matteo Buffolo, Univ. degli Studi di Padova (Italy)
Nicola Trivellin, Univ. degli Studi di Padova (Italy)
Giovanna Mura, Univ. degli Studi di Cagliari (Italy)
Massimo Vanzi, Univ. degli Studi di Cagliari (Italy)
Andrea Migliori, CNR-IMM Section of Bologna (Italy)
Vittorio Morandi, CNR-IMM Section of Bologna (Italy)
Gaudenzio Meneghesso, Univ. degli Studi di Padova (Italy)
Enrico Zanoni, Univ. degli Studi di Padova (Italy)


Published in SPIE Proceedings Vol. 10124:
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXI
Jong Kyu Kim; Michael R. Krames; Li-Wei Tu; Martin Strassburg, Editor(s)

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