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Proceedings Paper

Study of femtosecond laser spectrally resolved interferometry distance measurement based on excess fraction method
Author(s): Rongyi Ji; Kun Hu; Yao Li; Shuyuan Gao; Weihu Zhou
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Paper Abstract

Spectrally resolved interferometry (SRI) technology is a high precision laser interferometry technology, whose short non-ambiguity range (NAR) increases the precision requirement of pre-measurement in absolute distance measurement. In order to improve NAR of femtosecond laser SRI, the factors affecting NAR are studied in measurement system, and synthetic NAR method is presented based on excess fraction method to solve this question. A theoretical analysis is implemented and two Fabry-Perot Etalons with different free spectral range are selected to carry out digital simulation experiments. The experiment shows that NAR can be improved using synthetic NAR method and the precision is the same with that of fundamental femtosecond laser SRI.

Paper Details

Date Published: 28 February 2017
PDF: 8 pages
Proc. SPIE 10256, Second International Conference on Photonics and Optical Engineering, 102565S (28 February 2017); doi: 10.1117/12.2255828
Show Author Affiliations
Rongyi Ji, Academy of Opto-Electronics (China)
Kun Hu, Academy of Opto-Electronics (China)
Hauzhong Univ. of Science and Technology (China)
Yao Li, Academy of Opto-Electronics (China)
Huazhong Univ. of Science and Technology (China)
Shuyuan Gao, Academy of Opto-Electronics (China)
HeFei Univ. of Technology (China)
Weihu Zhou, Academy of Opto-Electronics (China)
Univ. of Chinese Academy of Sciences (China)

Published in SPIE Proceedings Vol. 10256:
Second International Conference on Photonics and Optical Engineering
Chunmin Zhang; Anand Asundi, Editor(s)

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