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Proceedings Paper

Advanced optical 3D scanners using DMD technology
Author(s): P. Muenstermann; R. Godding; M. Hermstein
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Paper Abstract

Optical 3D measurement techniques are state-of-the-art for highly precise, non-contact surface scanners - not only in industrial development, but also in near-production and even in-line configurations. The need for automated systems with very high accuracy and clear implementation of national precision standards is growing extremely due to expanding international quality guidelines, increasing production transparency and new concepts related to the demands of the fourth industrial revolution. The presentation gives an overview about the present technical concepts for optical 3D scanners and their benefit for customers and various different applications – not only in quality control, but also in design centers or in medical applications. The advantages of DMD-based systems will be discussed and compared to other approaches. Looking at today’s 3D scanner market, there is a confusing amount of solutions varying from lowprice solutions to high end systems. Many of them are linked to a very special target group or to special applications. The article will clarify the differences of the approaches and will discuss some key features which are necessary to render optical measurement systems suitable for industrial environments. The paper will be completed by examples for DMDbased systems, e. g. RGB true-color systems with very high accuracy like the StereoScan neo of AICON 3D Systems. Typical applications and the benefits for customers using such systems are described.

Paper Details

Date Published: 20 February 2017
PDF: 9 pages
Proc. SPIE 10117, Emerging Digital Micromirror Device Based Systems and Applications IX, 1011708 (20 February 2017); doi: 10.1117/12.2254960
Show Author Affiliations
P. Muenstermann, AICON 3D Systems GmbH (Germany)
R. Godding, AICON 3D Systems GmbH (Germany)
M. Hermstein, AICON 3D Systems GmbH (Germany)


Published in SPIE Proceedings Vol. 10117:
Emerging Digital Micromirror Device Based Systems and Applications IX
Michael R. Douglass; Benjamin L. Lee, Editor(s)

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