Share Email Print
cover

Proceedings Paper

Single image sectioning using spatial frequency domain imaging
Author(s): Zachary R. Hoffman; Charles A. DiMarzio
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Structured illumination microscopy (SIM) works well to produce depth information by removing undesired light from out of focus planes within a specimen. However, it generally requires multiple images in order to produce sectioning. We show that, under the right conditions, we can leverage Spatial Frequency Domain Imaging (SFDI) to produce both sectioning and relative depth information about a specimen using only a single image. After processing, we find that the axial resolution is comparable to that of traditional 3 phase SIM. With this technique, we are able to produce real-time videos in-vivo at 21 frames per second. Additionally, no moving parts are needed to produce sectioning at depth.

Paper Details

Date Published: 22 March 2017
PDF: 6 pages
Proc. SPIE 10070, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIV, 1007014 (22 March 2017); doi: 10.1117/12.2254734
Show Author Affiliations
Zachary R. Hoffman, Northeastern Univ. (United States)
Draper Lab. (United States)
Charles A. DiMarzio, Northeastern Univ. (United States)


Published in SPIE Proceedings Vol. 10070:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIV
Thomas G. Brown; Carol J. Cogswell; Tony Wilson, Editor(s)

© SPIE. Terms of Use
Back to Top