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Proceedings Paper

Highly sensitive measurement of submicron waveguides based on Brillouin scattering
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Paper Abstract

Fabrication and characterization of submicron optical waveguides is one of the major challenges in modern photonics, as they find many applications from optical sensors to plasmonic devices. Here we report on a novel technique that allows for a complete and precise characterization of silica optical nanofibers. Our method relies on the Brillouin backscattering spectrum analysis that directly depends on the waveguide geometry. Our method was applied to several fiber tapers with diameter ranging from 500 nm to 3 μm. Results were compared to scanning electron microscopy (SEM) images and numerical simulations with very good agreement and similar sensitivity.

Paper Details

Date Published: 20 February 2017
PDF: 7 pages
Proc. SPIE 10110, Photonic Instrumentation Engineering IV, 1011009 (20 February 2017); doi: 10.1117/12.2253703
Show Author Affiliations
Adrien Godet, Institut FEMTO-ST, Univ. Bourgogne Franche-Comté, CNRS (France)
Abdoulaye Ndao, Institut FEMTO-ST, Univ. Bourgogne Franche-Comté, CNRS (France)
Thibaut Sylvestre, Institut FEMTO-ST, Univ. Bourgogne Franche-Comté, CNRS (France)
Jean-Charles Beugnot, Institut FEMTO-ST, Univ. Bourgogne Franche-Comté, CNRS (France)
Kien Phan Huy, Institut FEMTO-ST, Univ. Bourgogne Franche-Comté, CNRS (France)


Published in SPIE Proceedings Vol. 10110:
Photonic Instrumentation Engineering IV
Yakov G. Soskind; Craig Olson, Editor(s)

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