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Proceedings Paper

Coordinate measuring system based on microchip lasers for reverse prototyping
Author(s): Alexey Iakovlev; Alexsandr S. Grishkanich; Dmitriy Redka; Konstantin Tsvetkov
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Paper Abstract

According to the current great interest concerning Large-Scale Metrology applications in many different fields of manufacturing industry, technologies and techniques for dimensional measurement have recently shown a substantial improvement. Ease-of-use, logistic and economic issues, as well as metrological performance, are assuming a more and more important role among system requirements. The project is planned to conduct experimental studies aimed at identifying the impact of the application of the basic laws of chip and microlasers as radiators on the linear-angular characteristics of existing measurement systems. The project is planned to conduct experimental studies aimed at identifying the impact of the application of the basic laws of microlasers as radiators on the linear-angular characteristics of existing measurement systems. The system consists of a distributed network-based layout, whose modularity allows to fit differently sized and shaped working volumes by adequately increasing the number of sensing units. Differently from existing spatially distributed metrological instruments, the remote sensor devices are intended to provide embedded data elaboration capabilities, in order to share the overall computational load.

Paper Details

Date Published: 24 February 2017
PDF: 10 pages
Proc. SPIE 10095, Laser 3D Manufacturing IV, 1009514 (24 February 2017); doi: 10.1117/12.2253538
Show Author Affiliations
Alexey Iakovlev, ITMO Univ. (Russian Federation)
Alexsandr S. Grishkanich, ITMO Univ. (Russian Federation)
Dmitriy Redka, St. Petersburg State Electrotechnical Univ. (Russian Federation)
Konstantin Tsvetkov, JSC Shipbuilding and Ship Repair Technology Ctr. (Russian Federation)


Published in SPIE Proceedings Vol. 10095:
Laser 3D Manufacturing IV
Bo Gu; Henry Helvajian; Alberto Piqué; Corey M. Dunsky; Jian Liu, Editor(s)

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