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Proceedings Paper

Design and characterization of 1.1 micron pixel image sensor with high near infrared quantum efficiency
Author(s): Zach M. Beiley; Andras Pattantyus-Abraham; Erin Hanelt; Bo Chen; Andrey Kuznetsov; Naveen Kolli; Edward H. Sargent
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Paper Abstract

At the 940 nm wavelength, solar background irradiance is relatively low and device-mounted monochromatic LED emission can be used to illuminate and assess the shape, distance, and optical properties of objects. We report here NIR imaging that outperforms existing CMOS sensors by achieving record 42% quantum efficiency at 940 nm for a 1.1 μm pixel. The rationally engineered material properties of QuantumFilm allow tuning of the spectral response to the desired wavelength to achieve quantum efficiency that exceeds 40%. In addition, the combination of high QE with QuantumFilm’s distinctive film-based electronic global shutter mechanism allows for extremely low illumination power and therefore lowers time-averaged system power when imaging with active illumination.

Paper Details

Date Published: 16 February 2017
PDF: 8 pages
Proc. SPIE 10100, Optical Components and Materials XIV, 101001B (16 February 2017); doi: 10.1117/12.2253192
Show Author Affiliations
Zach M. Beiley, InVisage Technologies, Inc. (United States)
Andras Pattantyus-Abraham, InVisage Technologies, Inc. (United States)
Erin Hanelt, InVisage Technologies, Inc. (United States)
Bo Chen, InVisage Technologies, Inc. (United States)
Andrey Kuznetsov, InVisage Technologies, Inc. (United States)
Naveen Kolli, InVisage Technologies, Inc. (United States)
Edward H. Sargent, InVisage Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 10100:
Optical Components and Materials XIV
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

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