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Advanced temporal characterization of free electron laser pulses at European XFEL by THz photoelectron spectroscopy
Author(s): Jia Liu; Jan Grünert
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Paper Abstract

We report an on-going temporal characterization project and method on a shot-to-shot basis for free electron laser pulses by using THz photoelectron spectroscopy at the European XFEL facility. Shot to shot FEL time jitter and pulse profile information can be reconstructed by resolving the photoelectrons energy spectra in an external THz field. Laser based THz generation and optimization, photoelectron generation and detection are described. Further considerations of the temporal resolution based on proposed photoelectron lines are presented and intuitive simulations are made to demonstrate the feasibility of such technique.

Paper Details

Date Published: 24 February 2017
PDF: 9 pages
Proc. SPIE 10103, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications X, 101030E (24 February 2017); doi: 10.1117/12.2253138
Show Author Affiliations
Jia Liu, European XFEL GmbH (Germany)
Jan Grünert, European XFEL GmbH (Germany)


Published in SPIE Proceedings Vol. 10103:
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications X
Laurence P. Sadwick; Tianxin Yang, Editor(s)

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