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Proceedings Paper

Micro-Raman characterization of SiC polytype natural heterostructures
Author(s): Victor V. Artamonov; Alexei V. Pogorelov; Marion Renucci; Mikhail Ya. Valakh
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Paper Abstract

MicroRaman, Raman, photoluminescence and x-ray diffraction spectra were measured for different SiC splices. It has been shown that Raman and especially MicroRaman scattering gives us a gain over other diagnostic techniques on the way to define polytype structure of the splice.

Paper Details

Date Published: 23 October 1995
PDF: 5 pages
Proc. SPIE 2543, Silicon Carbide Materials for Optics and Precision Structures, (23 October 1995); doi: 10.1117/12.225295
Show Author Affiliations
Victor V. Artamonov, Institute of Semiconductor Physics (Ukraine)
Alexei V. Pogorelov, Institute of Semiconductor Physics (Ukraine)
Marion Renucci, Univ. Paul Sabatier (France)
Mikhail Ya. Valakh, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 2543:
Silicon Carbide Materials for Optics and Precision Structures
Mark A. Ealey, Editor(s)

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