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Proceedings Paper

An accurate frequency-modulated continuous-wave method for fast terahertz thickness measurements
Author(s): Nina S. Schreiner; Bessem Baccouche; Wolfgang Sauer-Greff; Ralph Urbansky; Fabian Friederich
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Date Published:
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Proc. SPIE 10103, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications X, 101030V; doi: 10.1117/12.2252942
Show Author Affiliations
Nina S. Schreiner, Fraunhofer-Institut für Physikalische Messtechnik (Germany)
Bessem Baccouche, Fraunhofer-Institut für Physikalische Messtechnik (Germany)
Wolfgang Sauer-Greff, Technische Univ. Kaiserslautern (Germany)
Ralph Urbansky, Technische Univ. Kaiserslautern (Germany)
Fabian Friederich, Fraunhofer-Institut für Physikalische Messtechnik (Germany)


Published in SPIE Proceedings Vol. 10103:
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications X
Laurence P. Sadwick; Tianxin Yang, Editor(s)

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