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Proceedings Paper

Insertion loss study for panel-level single-mode glass waveguides
Author(s): M. Neitz; J. Röder-Ali; S. Marx; C. Herbst; C. Frey; H. Schröder; K.-D. Lang
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Paper Abstract

The paper compares the results of panel- and wafer-level processing of display glass integrated single mode optical waveguides. The comparison is based on measurements of the same optical structures processed using panel- and waferlevel technology. Additionally, large panels of 440 mm x 305 mm where manufactured to prove the scalability of the single-mode process. Measurements are done by optical back scattering reflectometry using a Luna OBR 4600 and a fiber-based propagation loss measurement setup. Based on these results of diverse processing equipment and substrate dimensions, a comprehensive statistic is shown and error estimation made to compare the different technologies.

Paper Details

Date Published: 20 February 2017
PDF: 8 pages
Proc. SPIE 10109, Optical Interconnects XVII, 101090J (20 February 2017); doi: 10.1117/12.2252802
Show Author Affiliations
M. Neitz, Technische Univ. Berlin (Germany)
J. Röder-Ali, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Germany)
S. Marx, Technische Univ. Berlin (Germany)
C. Herbst, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Germany)
C. Frey, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Germany)
H. Schröder, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Germany)
K.-D. Lang, Technische Univ. Berlin (Germany)


Published in SPIE Proceedings Vol. 10109:
Optical Interconnects XVII
Henning Schröder; Ray T. Chen, Editor(s)

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