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Proceedings Paper

Theoretical analysis of lateral resolution given by annular super-resolution phase plate
Author(s): Hiroshi Kumagai; Yoshinori Iketaki; Koumei Nagai; Nador Bokor
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Paper Abstract

We investigated lateral resolution in super-resolution microscopy based on fluorescence depletion, when an annular phase plate is applied to the erase beam. Applying a high NA the objective lens to microscopy, resolution becomes closer to that given by a spiral phase plate.

Paper Details

Date Published: 17 February 2017
PDF: 3 pages
Proc. SPIE 10070, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIV, 100701L (17 February 2017); doi: 10.1117/12.2250814
Show Author Affiliations
Hiroshi Kumagai, Kitasato Univ. (Japan)
Yoshinori Iketaki, Olympus Corp. (Japan)
Kitasato Univ. (Japan)
Koumei Nagai, NTT Advanced Technology Corp. (Japan)
Nador Bokor, Budapest Univ. of Technology and Economics (Hungary)


Published in SPIE Proceedings Vol. 10070:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIV
Thomas G. Brown; Carol J. Cogswell; Tony Wilson, Editor(s)

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