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Proceedings Paper

The design of cathode for organic photovoltaic devices
Author(s): De Song; Feng Shi; Xuan Xia; Ye Li; Qingduo Duanmu
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Paper Abstract

We have discussed the effect of the residual gas in the Al metal cathode deposition process and consequently influence the performance of organic photovoltaic devices (such as organic photoelectron detector or solar cell). We believe that the origin of degradation in Jsc and FF from the Al cathode device should be the formation of AlOx in the C60-Al interface, which contaminate the interface and plays a role like an energy barrier that block the charge collect process. To solve this problem the Ag and Alq3 layer had been inserted before the Al. Owing to the advantageous of Alq3 and Ag layer, the device which Al cathode prepared at a lower vacuum condition exhibits a comparable performance to that device which Al cathode deposited in regular situation. As an additional benefit, since the introducing of Alq3/Ag layer in the VOPc/C60 organic photovoltaic device performs a better near-infrared response, this phenomenon has been confirmed by means of both simulation and experimental data. So the design of our new cathode structure provides a degree of freedom to modulate the light absorption for organic photovoltaic devices in short-wave and long-wave.

Paper Details

Date Published: 7 November 2016
PDF: 7 pages
Proc. SPIE 10141, Selected Papers of the Chinese Society for Optical Engineering Conferences held July 2016, 101410X (7 November 2016); doi: 10.1117/12.2249740
Show Author Affiliations
De Song, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Changchun Univ. of Science and Technology (China)
Feng Shi, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Xuan Xia, Changchun Univ. of Science and Technology (China)
Ye Li, Changchun Univ. of Science and Technology (China)
Qingduo Duanmu, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10141:
Selected Papers of the Chinese Society for Optical Engineering Conferences held July 2016
Yueguang Lv; Weimin Bao; Guangjun Zhang, Editor(s)

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