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Proceedings Paper

X-ray powder diffraction study of some dopant positions in unit cells of chosen AIIBVI compounds crystals
Author(s): E. Michalski; Mieczyslaw Demianiuk
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Paper Abstract

The characteristic changes in relative reflections intensity (without substantial change of their positions and without any additional reflexes from any new phases) on x-ray powder diffraction patterns from different doped AIIBVI compound crystals have been experimentally registered. On the basis of the powder diffraction data the changes in the lattice constants (increasing as well as decreasing) have been confirmed too. These changes have been tried to be connected with crystal structure under the assumption of statistical occupation of parts of positions chosen from positions possible to occupy in the lattice. The qualitative conformity of calculated relative intensity of x-ray reflections for the best matched models with obtained experimentally and also qualitative conformity of changes in lattice constants have been obtained for examined cases. Simultaneously the possibility of obtaining such conformity for other models (with dopants occupying other positions in lattice) have been excluded. It allows us to determine the position occupying by dopants and to estimate the relative contents of dopants.

Paper Details

Date Published: 16 October 1995
PDF: 10 pages
Proc. SPIE 2373, Solid State Crystals: Materials Science and Applications, (16 October 1995); doi: 10.1117/12.224968
Show Author Affiliations
E. Michalski, Military Academy of Technology (Poland)
Mieczyslaw Demianiuk, Military Academy of Technology (Poland)


Published in SPIE Proceedings Vol. 2373:
Solid State Crystals: Materials Science and Applications
Jozef Zmija, Editor(s)

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