Share Email Print
cover

Proceedings Paper

Design of high-resolution XUV imaging spectrometer using spherical varied line-space grating
Author(s): Tatsuo Harada; Hideo Sakuma; Yasutaka Ikawa; Tetsuya Watanabe; Toshiaki Kita
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A high resolution XUV imaging spectrometer is designed for Japanese solar mission Solar-B. A spherical varied line-space (SVLS) grating is chosen so as to obtain high spectral and spatial resolution within the spectral range of 25 to 29 nm. The spectral image focusing properties are compared with those with toroidal uniform line-space (TULS) grating design and the SVLS design is found to be superior to the TULS design in off-plane spectral images and also in insensitiveness to optical misalignment.

Paper Details

Date Published: 16 October 1995
PDF: 9 pages
Proc. SPIE 2517, X-Ray and EUV/FUV Spectroscopy and Polarimetry, (16 October 1995); doi: 10.1117/12.224928
Show Author Affiliations
Tatsuo Harada, Tokyo Metropolitan Univ. (Japan)
Hideo Sakuma, Tokyo Metropolitan Univ. (Japan)
Yasutaka Ikawa, Tokyo Metropolitan Univ. (Japan)
Tetsuya Watanabe, National Astronomical Observatory (Japan)
Toshiaki Kita, Hitachi, Ltd. (Japan)


Published in SPIE Proceedings Vol. 2517:
X-Ray and EUV/FUV Spectroscopy and Polarimetry
Silvano Fineschi, Editor(s)

© SPIE. Terms of Use
Back to Top