Share Email Print
cover

Proceedings Paper

Calibration of the EIT instrument for the SOHO mission
Author(s): Jean-Marc Defise; Xueyan Song; Jean-Pierre Delaboudiniere; Guy Edouard Artzner; Charles Carabetian; Jean-Francois E. Hochedez; Jacqueline Brunaud; J. Daniel Moses; Richard C. Catura; Frederic Clette; Andre Jean Maucherat
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical characteristics in the wavelength range 15 - 75 nm of the EUV imaging telescope to be launched soon on the SOHO mission are discussed. Bandpasses and photometric sensitivity of the multilayered optics telescope have been measured by a dedicated synchrotron light source at Orsay, France.

Paper Details

Date Published: 16 October 1995
PDF: 11 pages
Proc. SPIE 2517, X-Ray and EUV/FUV Spectroscopy and Polarimetry, (16 October 1995); doi: 10.1117/12.224924
Show Author Affiliations
Jean-Marc Defise, Centre Spatial de Liege (Belgium)
Xueyan Song, Univ. de Paris XI (France)
Jean-Pierre Delaboudiniere, Univ. de Paris XI (France)
Guy Edouard Artzner, Univ. de Paris XI (France)
Charles Carabetian, Univ. de Paris XI (France)
Jean-Francois E. Hochedez, Univ. de Paris XI (France)
Jacqueline Brunaud, Univ. de Paris XI (France)
J. Daniel Moses, Naval Research Lab. (United States)
Richard C. Catura, Lockheed Palo Alto Research Lab. (United States)
Frederic Clette, Observatoire Royal de Belgique (Belgium)
Andre Jean Maucherat, Lab. d'Astronomie Spatiale/CNRS (France)


Published in SPIE Proceedings Vol. 2517:
X-Ray and EUV/FUV Spectroscopy and Polarimetry
Silvano Fineschi, Editor(s)

© SPIE. Terms of Use
Back to Top