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Proceedings Paper

Sensitivity to x-ray polarization of a microgap gas proportional counter
Author(s): Paolo Soffitta; Enrico Costa; Ennio Morelli; Ronaldo Bellazzini; Alessandro Brez; R. Raffo
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Paper Abstract

We measured the average anisotropy of the primary charge cloud produced by photoelectron when an x-ray beam linearly polarized is absorbed on a Ne-DME gas mixture by using a micro-gap proportional counter. This average anisotropy is not present when an Fe55 unpolarized x-ray source is used. We discuss the results of our measurement in terms of performances of this detector as an x-ray polarimeter.

Paper Details

Date Published: 16 October 1995
PDF: 8 pages
Proc. SPIE 2517, X-Ray and EUV/FUV Spectroscopy and Polarimetry, (16 October 1995); doi: 10.1117/12.224922
Show Author Affiliations
Paolo Soffitta, Istituto di Astrofisica Spaziale/CNR and Lab. Nazionali-INFN (Italy)
Enrico Costa, Istituto di Astrofisica Spaziale/CNR (Italy)
Ennio Morelli, Istituto Tecnologie e Studio Radiazioni Extraterrestri/CNR (Italy)
Ronaldo Bellazzini, Sezione Pisa-INFN (Italy)
Alessandro Brez, Sezione Pisa-INFN (Italy)
R. Raffo, Sezione Pisa-INFN (Italy)


Published in SPIE Proceedings Vol. 2517:
X-Ray and EUV/FUV Spectroscopy and Polarimetry
Silvano Fineschi, Editor(s)

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