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Proceedings Paper

Spectrograph design using a transmission sliced multilayer as a diffraction element for the x-ray region
Author(s): Michele Wilson; Muamer Zukic
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Paper Abstract

Spectrograph designs are presented that utilize a transmission sliced multilayer as a diffraction and focusing element. The multilayer utilizes the coincidence of Bragg and diffraction orders to achieve higher efficiency and resolution than a conventional grating. Traditionally, the lattice spacing in a crystal is used to achieve dispersion in the x-ray region. However, a multilayer as a diffraction element has some significant advantages. The layer thicknesses can be adjusted for any wavelength and for any angle of incidence. The transmission sliced multilayer is a dispersion element that satisfies the desirable properties of spectroscopy: high dispersion, high throughput, and high resolution. The sliced multilayer grating with a variable period can be used for both dispersion and imaging. Designs are studied for 17 keV and 34 keV with applications in mammography and IC chip inspection.

Paper Details

Date Published: 16 October 1995
PDF: 11 pages
Proc. SPIE 2517, X-Ray and EUV/FUV Spectroscopy and Polarimetry, (16 October 1995); doi: 10.1117/12.224909
Show Author Affiliations
Michele Wilson, Univ. of Alabama in Huntsville (United States)
Muamer Zukic, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 2517:
X-Ray and EUV/FUV Spectroscopy and Polarimetry
Silvano Fineschi, Editor(s)

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