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Proceedings Paper

Truncated pyramid artifact for performance evaluation experiments on laser line scanner
Author(s): Sen Zhou; Jian Xu; Tao Lei; Chen Long; Tang Jing
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Paper Abstract

Non-contact measurement techniques using 3D laser scanning have the power to deliver tremendous benefits to most notably manufacturing, and have the advantage of high speed and high detail output. However, procedures for evaluation and verification of non-contact laser line scanner have not been well-established because of many influencing factors like scan depth, incident angle, probe head orientation and surface properties. A truncated pyramid artifact representation of five- planar with different included angles was designed and used to straightforwardly identify the influence of in-plane and out-of-plane angle, as well as scan depth on dimensional measurement accuracy of the laser scanner. Then, a series of easy, fast and representative experiments, based on this simple artifact, were performed on a commercial laser line scanner, and found that the output of this scanner can be improved for metrology applications after calibration.

Paper Details

Date Published: 24 November 2016
PDF: 7 pages
Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 1002329 (24 November 2016); doi: 10.1117/12.2248455
Show Author Affiliations
Sen Zhou, Chongqing Academy of Metrology and Quality Inspection (China)
Jian Xu, Chongqing Academy of Metrology and Quality Inspection (China)
Tao Lei, Chongqing Academy of Metrology and Quality Inspection (China)
Chen Long, Chongqing Academy of Metrology and Quality Inspection (China)
Tang Jing, Chongqing Academy of Metrology and Quality Inspection (China)


Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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