Share Email Print
cover

Proceedings Paper

A parallel multibeam mask writing method and its impact on data volumes
Author(s): N. Chaudhary; Y. Luo; S. A. Savari
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The pattern requirements for mask writers have steadily been growing, and there is considerable interest in multibeam mask writers to handle the throughput and resolution challenges associated with the needs of sub- 10nm technology nodes. The mask writer of the future will process terabits of information per second and deal with petabytes of data. In this paper, we investigate lossless data compression and system parallelism together to address part of the data transfer problem. We explore simple compression algorithms and the effect of parallelism on the total compressed data in a multibeam system architecture motivated by the IMS Nanofabrication multibeam mask writer series eMET. We model the shot assignment problem and beam shot overlap by means of two-dimensional linear spatial filtering on an image. We describe a fast scanning strategy and investigate data volumes for a family of beam arrays with 2N ×(2N −1) beams, where N is an odd integer.

Paper Details

Date Published: 20 October 2016
PDF: 9 pages
Proc. SPIE 10032, 32nd European Mask and Lithography Conference, 1003206 (20 October 2016); doi: 10.1117/12.2248449
Show Author Affiliations
N. Chaudhary, Texas A and M Univ. (United States)
Y. Luo, Texas A and M Univ. (United States)
S. A. Savari, Texas A and M Univ. (United States)


Published in SPIE Proceedings Vol. 10032:
32nd European Mask and Lithography Conference
Uwe F.W. Behringer; Jo Finders, Editor(s)

© SPIE. Terms of Use
Back to Top