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Proceedings Paper

A study on frequency-shifted pulse light stability control for DP-MZM in coherent-OTDR
Author(s): Wenjie Chen; Junfeng Jiang; Kun Liu; Zhe Ma; Shuang Wang; Xuezhi Zhang; Zhenyang Ding; Tiegen Liu
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Paper Abstract

In digital coherent optical time domain reflectometer (coherent-OTDR) system, a dual-parallel Mach-Zehnder modulator (DP-MZM) is employed to modulate the signal light and to generate frequency-shifted pulse light. However, the environment temperature strongly influent the stability of the DP-MZM. To stabilize the quality of the frequency-shifted pulse light, we proposed a bias control method to keep the modulator at the optimum bias. This bias control method search for the optimum bias by changing three bias voltages at the same time based on chaotic particle swarm optimization algorithm(PSO). The experimental results show obvious effect on locating the optimum bias voltages for the DP-MZM.

Paper Details

Date Published: 14 November 2016
PDF: 6 pages
Proc. SPIE 10025, Advanced Sensor Systems and Applications VII, 100250D (14 November 2016); doi: 10.1117/12.2247765
Show Author Affiliations
Wenjie Chen, School of Precision Instrument and Opto-Electronics Engineering (China)
Tianjin Univ. (China)
Junfeng Jiang, School of Precision Instrument and Opto-Electronics Engineering (China)
Tianjin Univ. (China)
Kun Liu, School of Precision Instrument and Opto-Electronics Engineering (China)
Tianjin Univ. (China)
Zhe Ma, School of Precision Instrument and Opto-Electronics Engineering (China)
Tianjin Univ. (China)
Shuang Wang, School of Precision Instrument and Opto-Electronics Engineering (China)
Tianjin Univ. (China)
Xuezhi Zhang, School of Precision Instrument and Opto-Electronics Engineering (China)
Tianjin Univ. (China)
Zhenyang Ding, School of Precision Instrument and Opto-Electronics Engineering (China)
Tianjin Univ. (China)
Tiegen Liu, School of Precision Instrument and Opto-Electronics Engineering (China)
Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 10025:
Advanced Sensor Systems and Applications VII
Tiegen Liu; Shibin Jiang; Rene Landgraf, Editor(s)

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