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Proceedings Paper

Large diameter sapphire dome: fabrication and characterization
Author(s): John W. Locher; Harold E. Bennett; Philip C. Archibald; C. T. Newmyer
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Paper Abstract

A novel sapphire (99.99% Al2O single crystal) dome growth technique is described whereby a dome of a nominal radius of 38 to 40 mm is produced. A modified Edge-Defined Film-Fed Growth (EFGR ) technique is used to directly grow a dome blank with a wall thickness of 2.5 to 3 mm which requires a minimum of mechanical finishing and polishing. Total integrated scatter (TIS) results for the polished dome are reported for .6328 um and 3.39 um wavelengths. An evaluation of striae and bulk inhomogeneities is also given.

Paper Details

Date Published: 1 October 1990
PDF: 9 pages
Proc. SPIE 1326, Window and Dome Technologies and Materials II, (1 October 1990); doi: 10.1117/12.22476
Show Author Affiliations
John W. Locher, Saphikon Inc. (United States)
Harold E. Bennett, Naval Weapons Ctr. (United States)
Philip C. Archibald, Naval Weapons Ctr. (United States)
C. T. Newmyer, Naval Weapons Ctr. (United States)

Published in SPIE Proceedings Vol. 1326:
Window and Dome Technologies and Materials II
Paul Klocek, Editor(s)

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