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Proceedings Paper

Wave-front sensing for sparse aperture imaging system based on the sub-aperture phase diversity
Author(s): Junliu Fan; Quanying Wu; Baohua Chen; Zhenya Wang; Zhiyi Lu; Jun Wang
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Paper Abstract

The phase diversity wave-front sensing (PDWFS) technique is a posteriori image-based wave-front sensing method which utilizes two images collected simultaneously whose pupil phase differs from each other in a known manner, typically the defocus phase diversity. Here, we present a new method of implementing phase diversity on the sparse aperture imaging system that adds an intentional piston phase to one subaperture. The objective function is firstly derived for the sparse aperture imaging system, then the genetic algorithm is used to minimize the objective function to estimate the piston errors of the subapertures. Digital simulations are conducted for varying amounts of piston phase diversity and levels of noise, the performance of sub-aperture phase diversity is evaluated by comparing with the conventional defocus phase diversity. The results show that the conventional defocus phase diversity performs better than the sub-aperture phase diversity when there is no noise, while the sub-aperture phase diversity outperforms the conventional defocus phase diversity when the noise strength increases. Sub-aperture phase diversity may be an useful alternative if the conventional defocus phase diversity method fails.

Paper Details

Date Published: 31 October 2016
PDF: 7 pages
Proc. SPIE 10021, Optical Design and Testing VII, 100211X (31 October 2016); doi: 10.1117/12.2247587
Show Author Affiliations
Junliu Fan, Suzhou Univ. of Science and Technology (China)
Quanying Wu, Suzhou Univ. of Science and Technology (China)
Baohua Chen, Suzhou Univ. of Science and Technology (China)
Zhenya Wang, Suzhou Univ. of Science and Technology (China)
Zhiyi Lu, Soochow Univ. (China)
Jun Wang, Suzhou Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10021:
Optical Design and Testing VII
Yongtian Wang; Tina E. Kidger; Kimio Tatsuno, Editor(s)

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