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Proceedings Paper

Development of automated self-calibration spectra-radiometer
Author(s): Xin Li; Li-na Xun; En-chao Liu; Yan-na Zhang; Wen-chao Zhai; Wei Wei; Quan Zhang; Gang-gang Qiu; Xiao-bing Zheng
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Paper Abstract

Test site vicarious calibration provides an absolute radiometric calibration for sensors. Surface reflectance is a critical parameter to be measured during a vicarious calibration field campaign. In order to realize long-term high precision observations of surface spectral reflectance in solar reflective bands, Automated Self-Calibration Spectra-Radiometer (ASCSR) was developed. ASCSR measures the global irradiance and the ground reflected radiance respectively with high spectral resolution from 400nm-2400 nm, the ratio of the two measurements is the surface reflectance. The degradation influences of instrument sensors and optical elements are removed by ratio-measurements and self-calibration. In the past two years ASCSR deployed in Dunhuang test site for continuous spectral reflectance measurements over 4 weeks. The measurements result of ASCSR is compared with traditional measurements which used SVC spectra-radiometer.

Paper Details

Date Published: 19 October 2016
PDF: 7 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101553W (19 October 2016); doi: 10.1117/12.2247557
Show Author Affiliations
Xin Li, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)
Li-na Xun, Anhui Univ. (China)
En-chao Liu, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)
Yan-na Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)
Wen-chao Zhai, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)
Wei Wei, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)
Quan Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)
Gang-gang Qiu, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)
Xiao-bing Zheng, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)


Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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