Share Email Print
cover

Proceedings Paper

Error analysis of standard wave-front reconstruction based on spatial light modulator
Author(s): Xiao Ma; Shijie Liu; Zhigang Zhang; Jianda Shao
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The invention of spatial light modulator (SLM) promotes the development of aspheric surface test. SLM has the advantage of real-time and low-cost in comparison with the etching computer-generated hologram(CGH) plate. The pixel-structure of SLM, which includes the pixel pitch, gray-level number and black matrix, has great significance on the reconstructed wave-front quality. In this paper, the effects of SLM pixel pitch, gray-level number and black matrix are analyzed by Fresnel diffraction theory and computer simulation. In the simulation, a concave spherical wave-front with a radius of 1000 mm is generated by the SLM with different pixel pitch, gray-level numbers and aperture ratios, respectively. The results show that the quality of the reconstructed wave-front gets poorer as the pixel pitch increases, the gray-level number decreases or the aperture ratio reduces. This work can guide the selection of the SLM in the aspheric surface test.

Paper Details

Date Published: 19 October 2016
PDF: 6 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101553M (19 October 2016); doi: 10.1117/12.2247407
Show Author Affiliations
Xiao Ma, Shanghai Institute of Optics and Fine Mechanics (China)
Shijie Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Zhigang Zhang, Shanghai Institute of Optics and Fine Mechanics (China)
Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

© SPIE. Terms of Use
Back to Top