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Proceedings Paper

The microstructure measurement of surface defects of optical component based on digital image-plane holographic microscopy
Author(s): Zhu Chen; Hongzhen Jiang; Xu Liu; Fanglan Zheng; Dong Li; Yong Liu; Bo Chen; Xiaoyu Yang
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Paper Abstract

In order to measure the three-dimensional microstructure of surface defects on optical component, a novel measuring method based on digital image-plane holographic microscopy (DIPHM) is proposed in this paper. The experimental system has been designed and built to measure the microstructure of optical component’s surface defects. The object light wavefront can be reconstructed by using the algorithm based on the angular spectrum theory, and the technique of phase correction is contributive to eliminate the system error. There is a definite relationship between the object light wavefront and the surface topography, so the 3D microstructure of surface defects can be measured. This measuring technique is helpful to judge the damage degree of the optical component and analysis the influence of the surface defects, and it is of great significance to ensure the laser system security running.

Paper Details

Date Published: 19 October 2016
PDF: 6 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101553H (19 October 2016); doi: 10.1117/12.2247384
Show Author Affiliations
Zhu Chen, China Academy of Engineering Physics (China)
Hongzhen Jiang, China Academy of Engineering Physics (China)
Xu Liu, China Academy of Engineering Physics (China)
Fanglan Zheng, China Academy of Engineering Physics (China)
Dong Li, China Academy of Engineering Physics (China)
Yong Liu, China Academy of Engineering Physics (China)
Bo Chen, China Academy of Engineering Physics (China)
Xiaoyu Yang, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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