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Proceedings Paper

Beam hardening correction for interior tomography based on exponential formed model and radon inversion transform
Author(s): Siyu Chen; Hanming Zhang; Lei Li; Xiaoqi Xi; Yu Han; Bin Yan
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Paper Abstract

X-ray computed tomography (CT) has been extensively applied in industrial non-destructive testing (NDT). However, in practical applications, the X-ray beam polychromaticity often results in beam hardening problems for image reconstruction. The beam hardening artifacts, which manifested as cupping, streaks and flares, not only debase the image quality, but also disturb the subsequent analyses. Unfortunately, conventional CT scanning requires that the scanned object is completely covered by the field of view (FOV), the state-of-art beam hardening correction methods only consider the ideal scanning configuration, and often suffer problems for interior tomography due to the projection truncation. Aiming at this problem, this paper proposed a beam hardening correction method based on radon inversion transform for interior tomography. Experimental results show that, compared to the conventional correction algorithms, the proposed approach has achieved excellent performance in both beam hardening artifacts reduction and truncation artifacts suppression. Therefore, the presented method has vitally theoretic and practicable meaning in artifacts correction of industrial CT.

Paper Details

Date Published: 19 October 2016
PDF: 4 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101553D (19 October 2016); doi: 10.1117/12.2247372
Show Author Affiliations
Siyu Chen, National Digital Switching System Engineering and Technological Research Ctr. (China)
Shenzhen Institutes of Advanced Technology (China)
Hanming Zhang, National Digital Switching System Engineering and Technological Research Ctr. (China)
Lei Li, National Digital Switching System Engineering and Technological Research Ctr. (China)
Xiaoqi Xi, National Digital Switching System Engineering and Technological Research Ctr. (China)
Yu Han, National Digital Switching System Engineering and Technological Research Ctr. (China)
Bin Yan, National Digital Switching System Engineering and Technological Research Ctr. (China)


Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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