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Proceedings Paper

A defocus-information-free autostereoscopic three-dimensional (3D) digital reconstruction method using direct extraction of disparity information (DEDI)
Author(s): Da Li; Chifai Cheung; Xing Zhao; Mingjun Ren; Juan Zhang; Liqiu Zhou
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Paper Abstract

Autostereoscopy based three-dimensional (3D) digital reconstruction has been widely applied in the field of medical science, entertainment, design, industrial manufacture, precision measurement and many other areas. The 3D digital model of the target can be reconstructed based on the series of two-dimensional (2D) information acquired by the autostereoscopic system, which consists multiple lens and can provide information of the target from multiple angles. This paper presents a generalized and precise autostereoscopic three-dimensional (3D) digital reconstruction method based on Direct Extraction of Disparity Information (DEDI) which can be used to any transform autostereoscopic systems and provides accurate 3D reconstruction results through error elimination process based on statistical analysis. The feasibility of DEDI method has been successfully verified through a series of optical 3D digital reconstruction experiments on different autostereoscopic systems which is highly efficient to perform the direct full 3D digital model construction based on tomography-like operation upon every depth plane with the exclusion of the defocused information. With the absolute focused information processed by DEDI method, the 3D digital model of the target can be directly and precisely formed along the axial direction with the depth information.

Paper Details

Date Published: 19 October 2016
PDF: 5 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 1015538 (19 October 2016); doi: 10.1117/12.2247350
Show Author Affiliations
Da Li, The Hong Kong Polytechnic Univ. (Hong Kong, China)
Chifai Cheung, The Hong Kong Polytechnic Univ. (Hong Kong, China)
Xing Zhao, Nankai Univ. (China)
Mingjun Ren, The Hong Kong Polytechnic Univ. (Hong Kong, China)
Juan Zhang, Nankai Univ. (China)
Liqiu Zhou, Nankai Univ. (China)


Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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