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Proceedings Paper

Programming implementation of performance testing of low light level ICCD camera based on LabVIEW software
Author(s): Li Ni; Qiong Ye; Yunsheng Qian
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Paper Abstract

Low light level (LLL) imaging technology major roles in the night and in other low light illumination stage, through a variety of low light level image intensifier and charge-coupled device (CCD), gains image information on the target acquisition, photoelectric conversion and high-performance enhancement, storing and displaying. In order to comprehensively test the parameters such as intensified charge-coupled device (ICCD) signal noise ratio (SNR) and dynamic range, this paper uses Laboratory Virtual Instrument Engineering Platform (LabVIEW) software for programming. Data acquisition is the core of the entire software programming, according to the function; it is divided into three parts: a) initializing acquisition cards; b) data collection and storage of useful data; c) closing the acquisition card. NI PXIe-5122 analog acquisition card and PXIe-1435 digital acquisition card were used to collect pal cameras and camera link cameras’ shooting pictures, developing with analog interface and the digital interface of ICCD test work. After obtaining data, we can then analyze the performance of the camera by calculating the data according to the principle programmed parameters. Experimental testing process, the use of half-moon test target signal to noise ratio, dynamic range parameters and uniformity test target will be normal. Meanwhile, in order to increase the practicality of the program, we also add the database module into the program. LabSQL is a free, multi-database, cross-platform database access LabVIEW Toolkit. Using LabSQL can access almost any type of database, perform a variety of inquiries and record various operations. With just a simple programming, database access can be achieved in LabVIEW.

Paper Details

Date Published: 19 October 2016
PDF: 9 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101552V (19 October 2016); doi: 10.1117/12.2247237
Show Author Affiliations
Li Ni, Nanjing Univ. of Science and Technology (China)
Qiong Ye, Nanjing Univ. of Science and Technology (China)
Yunsheng Qian, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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