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Proceedings Paper

High temperature spectral emissivity measurement using integral blackbody method
Author(s): Yijie Pan; Wei Dong; Hong Lin; Zundong Yuan; Pieter Bloembergen
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Paper Abstract

Spectral emissivity is a critical material’s thermos-physical property for heat design and radiation thermometry. A prototype instrument based upon an integral blackbody method was developed to measure material’s spectral emissivity above 1000 ℃. The system was implemented with an optimized commercial variable-high-temperature blackbody, a high speed linear actuator, a linear pyrometer, and an in-house designed synchronization circuit. A sample was placed in a crucible at the bottom of the blackbody furnace, by which the sample and the tube formed a simulated blackbody which had an effective total emissivity greater than 0.985. During the measurement, the sample was pushed to the end opening of the tube by a graphite rod which was actuated through a pneumatic cylinder. A linear pyrometer was used to monitor the brightness temperature of the sample surface through the measurement. The corresponding opto-converted voltage signal was fed and recorded by a digital multi-meter. A physical model was proposed to numerically evaluate the temperature drop along the process. Tube was discretized as several isothermal cylindrical rings, and the temperature profile of the tube was measurement. View factors between sample and rings were calculated and updated along the whole pushing process. The actual surface temperature of the sample at the end opening was obtained. Taking advantages of the above measured voltage profile and the calculated true temperature, spectral emissivity under this temperature point was calculated.

Paper Details

Date Published: 1 November 2016
PDF: 7 pages
Proc. SPIE 10157, Infrared Technology and Applications, and Robot Sensing and Advanced Control, 1015730 (1 November 2016); doi: 10.1117/12.2247227
Show Author Affiliations
Yijie Pan, National Institute of Metrology (China)
Wei Dong, National Institute of Metrology (China)
Hong Lin, National Institute of Metrology (China)
Zundong Yuan, National Institute of Metrology (China)
Pieter Bloembergen, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 10157:
Infrared Technology and Applications, and Robot Sensing and Advanced Control

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