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Proceedings Paper

A new optical flat surface measurement method based on machine vision and deflectometry
Author(s): Kewei E.; Dahai Li; Lijie Yang; Guangrao Guo; Mengyang Li; Xuemin Wang; Tao Zhang; Zhao Xiong
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Paper Abstract

Phase Measuring Deflectometry(PMD) is a non-contact, high dynamic-range and full-field metrology which becomes a serious competitor to interferometry. However, the accuracy of deflectometry metrology is strongly influenced by the level of the calibrations. Our paper presents a calibration-based PMD method to test optical flat surface with a high accuracy. In our method, a pin-hole camera was set next to the LCD screen which is used to project sinusoidal fringes to the test flat. And the test flat was placed parallel to the direction of the LCD screen, which makes the geometry calibration process are simplified. The photogrammetric methods used in computer vision science was used to calibrate the pin-hole camera by using a checker pattern shown on another LCD display at six different orientations, the intrinsic parameters can be obtained by processing the obtained image of checker patterns. Further, by making the last orientation of checker pattern is aligned at the same position as the test optical flat, the algorithms used in this paper can obtain the mapping relationship between the CCD pixels and the subaperture coordinates on the test optical flat. We test a optical flat with a size of 50mm in diameter using our setup and algorithm. Our experimental results of optical flat figure from low to high order aberrations show a good agreement with that from the Fizeau interferometer.

Paper Details

Date Published: 19 October 2016
PDF: 8 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101551X (19 October 2016); doi: 10.1117/12.2246758
Show Author Affiliations
Kewei E., Sichuan Univ. (China)
Dahai Li, Sichuan Univ. (China)
Lijie Yang, Sichuan Univ. (China)
Guangrao Guo, Sichuan Univ. (China)
Mengyang Li, Sichuan Univ. (China)
Xuemin Wang, Sichuan Univ. (China)
Tao Zhang, Sichuan Univ. (China)
Zhao Xiong, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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