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Proceedings Paper

A high-speed and low-noise intelligent test system for infrared detectors
Author(s): Tianshi Jia; Yulong Xue; Kun Cui; Fansheng Kong
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Paper Abstract

With the development of infrared focal plane technology, the scale of the detector becomes larger and larger, and the pixel noise level is lower and lower. We designed and implemented a set of infrared high-speed low noise intelligent test system based on OPENVPX standard, which is used to test the index, long term monitoring and life test of infrared detector. The system is mainly composed of main control board, image acquisition board, temperature acquisition board and the high speed back board, which has high speed image acquisition, processing, temperature monitoring and alarm function. Through testing and simulation, the results show that the system noise is less than 100uV, the dynamic range reaches 100dB, and the data throughput rate reaches 4Gbps, which can meet the requirements of the infrared detector test currently.

Paper Details

Date Published: 3 November 2016
PDF: 8 pages
Proc. SPIE 10030, Infrared, Millimeter-Wave, and Terahertz Technologies IV, 100301E (3 November 2016); doi: 10.1117/12.2246425
Show Author Affiliations
Tianshi Jia, Shanghai Institute of Technical Physics (China)
Shanghai Univ. (China)
Yulong Xue, Shanghai Univ. (China)
Kun Cui, Shanghai Univ. (China)
Fansheng Kong, Shanghai Univ. (China)


Published in SPIE Proceedings Vol. 10030:
Infrared, Millimeter-Wave, and Terahertz Technologies IV
Cunlin Zhang; Xi-Cheng Zhang; Masahiko Tani, Editor(s)

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