Share Email Print
cover

Proceedings Paper

The study of fast measurement hexahedron verticality error by wavefront interferometer
Author(s): Shijun Peng; Songtao Gao; Dongcheng Wu; Erlong Miao
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper proposes a method to measure hexahedron vertical error based on wavefront interferometer and collimator. The setup of the measurement system and measurement steps is described. Comparing the vertical error of the same hexahedral surface adjacent measured by coordinate measurement machine, the validity of the measurement method is verified. Then not only the verticality error, but also form and shape error data of the two measured surface can be derived. The verticality error of adjacent surface is measured by the combination measurement method. Then surface figure error data for the two surfaces is measured by wavefront interferometer. The form and shape error data of one surface relative to the other can be obtained by added the verticality error to the surface figure error. This is very important in the part's error correction machining process. The effectiveness of the processing method has been verified by experiment. This method can achieve high measurement accuracy of 0.5″ and can be extended to high-precision shape and position errors measurement for other polyhedral parts.

Paper Details

Date Published: 24 November 2016
PDF: 11 pages
Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100230C (24 November 2016); doi: 10.1117/12.2246394
Show Author Affiliations
Shijun Peng, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Songtao Gao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Dongcheng Wu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Erlong Miao, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top