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Proceedings Paper

Investigation of transient temperature's influence on damage of high-speed sliding electrical contact rail surface
Author(s): Yuyan Zhang; Shasha Sun; Quanli Guo; Degong Yang; Dongtao Sun
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Paper Abstract

In the high speed sliding electrical contact with large current, the temperature of contact area rises quickly under the coupling action of the friction heating, the Joule heating and electric arc heating. The rising temperature seriously affects the conductivity of the components and the yield strength of materials, as well affects the contact state and lead to damage, so as to shorten the service life of the contact elements. Therefore, there is vital significance to measure the temperature accurately and investigate the temperature effect on damage of rail surface. Aiming at the problem of components damage in high speed sliding electrical contact, the transient heat effect on the contact surface was explored and its influence and regularity on the sliding components damage was obtained. A kind of real-time temperature measurement method on rail surface of high speed sliding electrical contact is proposed. Under the condition of 2.5 kA current load, based on the principle of infrared radiation non-contact temperature sensor was used to measure the rail temperature. The dynamic distribution of temperature field was obtained through the simulation analysis, further, the connection between temperature changes and the rail surface damage morphology, the damage volume was analyzed and established. Finally, the method to reduce rail damage and improve the life of components by changing the temperature field was discussed.

Paper Details

Date Published: 3 November 2016
PDF: 7 pages
Proc. SPIE 10030, Infrared, Millimeter-Wave, and Terahertz Technologies IV, 100302G (3 November 2016); doi: 10.1117/12.2246359
Show Author Affiliations
Yuyan Zhang, Yanshan Univ. (China)
Shasha Sun, Yanshan Univ. (China)
Quanli Guo, Yanshan Univ. (China)
Degong Yang, Yanshan Univ. (China)
Dongtao Sun, Yanshan Univ. (China)


Published in SPIE Proceedings Vol. 10030:
Infrared, Millimeter-Wave, and Terahertz Technologies IV
Cunlin Zhang; Xi-Cheng Zhang; Masahiko Tani, Editor(s)

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