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Proceedings Paper

Optical design of Offner-Chrisp imaging spectrometer with freeform surfaces
Author(s): Lidong Wei; Lei Feng; Jinsong Zhou; Juanjuan Jing; Yacan Li
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Paper Abstract

The Offner-Chrisp spectrometer is the preferred optical configuration in many spectroscopic imaging applications because it has several advantages over other similar instruments. Freeform surfaces enable imaginative optics by providing abundant degrees of freedom for an optical designer as compared to spherical surfaces, and offer many advantages in imaging application. An Offner-Chrisp imaging spectrometer with freeform surfaces is designed in this paper. The imaging spectrometer works at the wavelength range from 200 to 1500nm. The freeform surfaces are used to reduce the residual aberration over the large wavelength range and achieve a large flat field simultaneously. Different types of freeform surfaces are considered to evaluate their potential, e.g. anamorphic aspherical surface, X-Y polynomial surface and Zernike polynomial surface. Benefits from the freeform surfaces, the residual aberrations are well corrected, especially in the UV region and a flat field over the wide wavelength range is also obtained. The image quality is near diffraction limits. The smile and keystone are also well controlled <0.1μm.

Paper Details

Date Published: 31 October 2016
PDF: 8 pages
Proc. SPIE 10021, Optical Design and Testing VII, 100211P (31 October 2016); doi: 10.1117/12.2246355
Show Author Affiliations
Lidong Wei, Academy of Opto-Electronics (China)
Lei Feng, Academy of Opto-Electronics (China)
Jinsong Zhou, Academy of Opto-Electronics (China)
Juanjuan Jing, Academy of Opto-Electronics (China)
Yacan Li, Academy of Opto-Electronics (China)


Published in SPIE Proceedings Vol. 10021:
Optical Design and Testing VII
Yongtian Wang; Tina E. Kidger; Kimio Tatsuno, Editor(s)

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