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Proceedings Paper

The calibration of specular gloss meters and gloss plates
Author(s): Tiecheng Li; Lei Lai; Dejin Yin; Biyong Huang; Fangsheng Lin; Leibing Shi; Ming Xia
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Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100231W; doi: 10.1117/12.2246302
Show Author Affiliations
Tiecheng Li, Shanghai Institute of Measurement and Testing Technology (China)
Lei Lai, Shanghai Institute of Measurement and Testing Technology (China)
Dejin Yin, Shanghai Institute of Measurement and Testing Technology (China)
Biyong Huang, Shanghai Institute of Measurement and Testing Technology (China)
Fangsheng Lin, Shanghai Institute of Measurement and Testing Technology (China)
Leibing Shi, Shanghai Institute of Measurement and Testing Technology (China)
Ming Xia, Shanghai Institute of Measurement and Testing Technology (China)


Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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