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Proceedings Paper

A simple phase-shift ESPI for 3D deformation measurement
Author(s): Ping Sun; Xinghai Wang; Haibin Sun
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Paper Abstract

A simple setup for 3-D deformation measurement is offered. In the scheme a novel Cube Beam-Splitter, called Non- Cube Beam-Splitter (NCBS), is used for 3-D phase-shift Electronic Speckle Pattern Interferometry (ESPI). By using the NCBS lights from a tested object and lights from a reference surface, the reference and the object light can be combined and then interfere each other on a CCD camera when a laser beam illuminate the test object and the reference surface simultaneously. When three laser beams illuminate the test object at different incident angles respectively before and after deformation, three interference fringe patterns are formed. Then three phase maps corresponding to three lasers can be calculated by using phase-shift, by which three displacement components are completed. The principle of the method is presented and proved by a typical three-point bending experiment. Experimental results are offered.

Paper Details

Date Published: 24 November 2016
PDF: 6 pages
Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100231U (24 November 2016); doi: 10.1117/12.2246240
Show Author Affiliations
Ping Sun, Shandong Normal Univ. (China)
Xinghai Wang, Shandong Normal Univ. (China)
Haibin Sun, Shandong Normal Univ. (China)
Taishan Univ. (China)


Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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