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Proceedings Paper

Temporal speckle method for measuring three-dimensional surface of large-sized rough glass
Author(s): Chao Li; Changhe Zhou; Shaoqing Wang; Xin Fan; Boquan Yang; Yancong Lu; Hao Li; Zhao Liu
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Paper Abstract

To provide accurate three-dimensional (3-D) data for production and processing, 3-D surface measurement is always an essential step to the production of glass. Profilometry and Interferometry are traditional measurement apparatus, referring to different procedures. Although more precise, Interferometry cannot be used in milling procedure, owing to the scattering property of rough glass. While as a widely used Profilometry, Coordinate Measuring Machine (CMM) employs a probe for measuring by contacting surface directly. It should be noted that such a time-consuming machine is not practical for measuring large-sized rough glass, so a novel designed method called temporal speckle is introduced to a non-contact binocular 3-D measurement system for measuring. Specifically, N band-limited binary patterns are sequentially projected to rough glass from a pattern generation device, such patterns have been proved to depress scattering properties of rough surface. The whole binocular 3-D measurement system can finish a single measurement in one second with a standard deviation less than 73.44um. This system performs fast and accurate 3-D surface measurement for large-sized rough glass block.

Paper Details

Date Published: 31 October 2016
PDF: 8 pages
Proc. SPIE 10022, Holography, Diffractive Optics, and Applications VII, 100220N (31 October 2016); doi: 10.1117/12.2246077
Show Author Affiliations
Chao Li, Shanghai Institute of Optics and Fine Mechanics (China)
Changhe Zhou, Shanghai Institute of Optics and Fine Mechanics (China)
Shaoqing Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Xin Fan, Shanghai Institute of Optics and Fine Mechanics (China)
Boquan Yang, Shanghai Institute of Optics and Fine Mechanics (China)
Yancong Lu, Shanghai Institute of Optics and Fine Mechanics (China)
Hao Li, Shanghai Institute of Optics and Fine Mechanics (China)
Zhao Liu, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 10022:
Holography, Diffractive Optics, and Applications VII
Yunlong Sheng; Chongxiu Yu; Changhe Zhou, Editor(s)

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