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Proceedings Paper

An onsite non-contact dynamic angle metrology system based on stereo vision
Author(s): Jiping Guo; Jiping Yu; Xiang Peng; Ameng Li; Xiaoli Liu
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Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100231P; doi: 10.1117/12.2246042
Show Author Affiliations
Jiping Guo, Shenzhen Univ. (China)
Shenzhen Academy of Metrology and Quality Inspection (China)
Jiping Yu, Shenzhen Academy of Metrology and Quality Inspection (China)
Xiang Peng, Shenzhen Univ. (China)
Ameng Li, Shenzhen Academy of Metrology and Quality Inspection (China)
Xiaoli Liu, Shenzhen Univ. (China)


Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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