Share Email Print
cover

Proceedings Paper

Study of laser energy standard and establishment of calibration device
Author(s): Ming Xia; Jianqiang Gao; Junwen Xia; Dejin Yin; Tiecheng Li; Dong Zhang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper studied the standard laser energy meter. A self calibration of the thermoelectric type standard laser energy meter is developed, which is provided with a suitable electric heater. It can be used to simulate and replace the equivalent thermal effect, and to realize the absolute measurement of the laser energy. Because the standard laser energy meter can bulk absorb laser radiation, it can bear higher laser energy density. The material absorption spectrum of the standard laser energy meter is relatively flat from the ultraviolet to the infrared, so it can be used for the measurement of laser energy at any wavelength. In addition, an electric calibration instrument is developed. The electric calibration instrument can be directly displayed or synchronous display by the digital frequency meter. The laser energy calibration device is composed of standard laser energy meter, pulsed laser source, monitoring system, digital multi meter and complete set of electric calibration system. Laser energy calibration device uses split beam detection method. The laser is divided into two beams by means of a wedge shaped optical beam splitter. A laser energy meter is used to monitor the change of the reflected light to reduce the influence of the output laser energy stability of the pulsed laser source, thereby improving the uncertainty of the calibration result. The sensitivity, correction factor and indication error of the laser energy meter can be calibrated by using the standard laser energy meter and the under calibrated laser energy meter to measure the transmission laser beam.

Paper Details

Date Published: 19 October 2016
PDF: 5 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 1015518 (19 October 2016); doi: 10.1117/12.2245847
Show Author Affiliations
Ming Xia, Shanghai Institute of Measurement and Testing Technology (China)
Jianqiang Gao, Shanghai Institute of Measurement and Testing Technology (China)
Junwen Xia, Shanghai Institute of Measurement and Testing Technology (China)
Dejin Yin, Shanghai Institute of Measurement and Testing Technology (China)
Tiecheng Li, Shanghai Institute of Measurement and Testing Technology (China)
Dong Zhang, Shanghai Institute of Measurement and Testing Technology (China)


Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

© SPIE. Terms of Use
Back to Top