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Proceedings Paper

Application of thin dielectric films in low coherence fiber-optic Fabry-Pérot sensing interferometers: comparative study
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Paper Abstract

We examine the application of selected thin dielectric films, deposited by atomic layer deposition (ALD), in a low coherence fiber-optic Fabry-Pérot interferometer designed for sensing applications. Such films can be deposited on the end-face of a single mode optical fiber (SMF-28) in order to modify the reflectivity of the Fabry-Pérot cavity, to provide protection of the fibers from aggressive environments or to create a multi-cavity interferometric sensor. Spectral reflectance of films made from zinc oxide (ZnO), titanium dioxide (TiO2), aluminum oxide (Al2O3) and boron nitride (BN) was calculated for various thickness of the films and compared. The results show that the most promising materials for use in fiber-optic Fabry-Pérot interferometer are TiO2 and ZnO, although Al2O3 is also suitable for this application.

Paper Details

Date Published: 10 November 2016
PDF: 6 pages
Proc. SPIE 10161, 14th International Conference on Optical and Electronic Sensors, 101610D (10 November 2016); doi: 10.1117/12.2245841
Show Author Affiliations
Marzena Hirsch, Gdańsk Univ. of Technology (Poland)
Paweł Wierzba, Gdansk Univ. of Technology (Poland)
Małgorzata Jędrzejewska-Szczerska, Gdansk Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 10161:
14th International Conference on Optical and Electronic Sensors
Piotr Jasiński, Editor(s)

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